Microscopy, Electron, Scanning
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
Year introduced: 1972(1969)
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Subheadings:
Tree Number(s): E01.370.350.515.402.541, E05.595.402.541
MeSH Unique ID: D008855
Entry Terms:
- Electron Scanning Microscopy
- Electron Scanning Microscopies
- Microscopies, Electron Scanning
- Microscopy, Electron Scanning
- Scanning Microscopies, Electron
- Scanning Microscopy, Electron
- Scanning Electron Microscopy
- Electron Microscopies, Scanning
- Electron Microscopy, Scanning
- Microscopies, Scanning Electron
- Microscopy, Scanning Electron
- Scanning Electron Microscopies
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